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Si2Te

Alexandria ALEX

Alex-ID: agm005481835 · Space group: Cmcm (#63)

Basic Information

Formula
Si2Te
Alex-ID
agm005481835
Elements
2
Sites
6
Space group
Cmcm (#63)
Crystal system
orthorhombic
Volume
125.02
ų
Cell a
6.1357
Å
Cell b
6.1357
Å
Cell c
5.5206
Å
α angle
90.00
°
β angle
90.00
°
γ angle
143.02
°

Composition

Element Composition (atomic fraction)
Composition Info
Formula
Si2Te
Si
4.00 · 66.7%
Te
2.00 · 33.3%

Energy & Stability

Energy above hull
0.3112
eV/atom
Formation energy
0.2895
eV/atom
Corrected total energy
-26.2384
eV
Raw total energy
-26.2384
eV

Electronic Structure

Indirect band gap
0.0000
eV
Direct band gap
0.0007
eV
DOS at Fermi level
1.7001
Total magnetisation
0.0000
μB

Additional Information

Prototype ID

AB2_22_spg12

Decomposition

SiTe2 Si

Computed at

2023-03-21 22:33:30.017500

Citation

Alexandria website
https://alexandria.icams.rub.de/
Attribution

The crystal structure and related material properties of this entry were obtained from the Alexandria database (Alex-ID: agm005481835).

Reference

Th. Cavignac, J. Schmidt, P.-P. De Breuck, A. Loew, T. F. T. Cerqueira, H.-C. Wang, A. Bochkarev, Y. Lysogorskiy, A. H. Romero, R. Drautz, S. Botti and M. A. L. Marques. AI-Driven expansion and application of the Alexandria database. J. Phys. Mater. 9, 025014 (2026). https://doi.org/10.1088/2515-7639/ae6620

BibTeX
@article{Cavignac2026Alexandria,
  author  = {Cavignac, Th{\'e}o and Schmidt, Jonathan and De Breuck, Pierre-Paul and Loew, Antoine
             and Cerqueira, Tiago F. T. and Wang, Hai-Chen and Bochkarev, Anton
             and Lysogorskiy, Yury and Romero, Aldo H. and Drautz, Ralf and Botti, Silvana
             and Marques, Miguel A. L.},
  title   = {{AI}-Driven expansion and application of the {A}lexandria database},
  journal = {Journal of Physics: Materials},
  year    = {2026},
  volume  = {9},
  number  = {2},
  pages   = {025014},
  doi     = {10.1088/2515-7639/ae6620},
  url     = {https://doi.org/10.1088/2515-7639/ae6620}
}

3D Crystal Structure Rendering

Loading 3D structure…

Style: Ball & Stick
Raw CIF Data
# CIF generated by HEAS from Alexandria entry agm005481835
data_agm005481835
_cell_length_a     6.13571
_cell_length_b     6.13571
_cell_length_c     5.52060
_cell_angle_alpha  90.00000
_cell_angle_beta   90.00000
_cell_angle_gamma  143.01808
_cell_volume       125.02486
_symmetry_space_group_name_H-M 'P 1'
_symmetry_Int_Tables_number 1
loop_
_symmetry_equiv_pos_as_xyz
  'x, y, z'
loop_
_atom_site_label
_atom_site_type_symbol
_atom_site_fract_x
_atom_site_fract_y
_atom_site_fract_z
_atom_site_occupancy
  Si1 Si 0.85792 0.14208 0.75000 1.00000
  Si2 Si 0.48776 0.51224 0.75000 1.00000
  Si3 Si 0.14208 0.85792 0.25000 1.00000
  Si4 Si 0.51224 0.48776 0.25000 1.00000
  Te1 Te 0.17285 0.82715 0.75000 1.00000
  Te2 Te 0.82715 0.17285 0.25000 1.00000
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