Si3Os
Traditional Materials TRAMP-ID: mp-978508 · Space group: I4/mmm (#139)
Basic Information
X-ray Diffraction
| 2θ | d (Å) | I | hkl |
|---|---|---|---|
| 25.67 | 3.4705 | 100.0 | (1,0,0) |
| 28.40 | 3.1429 | 19.5 | (1,1,-1) |
| 30.37 | 2.9433 | 33.1 | (0,0,1) |
| 42.06 | 2.1483 | 81.9 | (1,1,0) |
| 43.48 | 2.0812 | 37.2 | (1,-1,1) |
| 48.65 | 1.8715 | 18.6 | (2,1,-1) |
| 51.18 | 1.7849 | 32.2 | (1,0,1) |
| 52.75 | 1.7353 | 14.7 | (2,0,0) |
| 58.76 | 1.5715 | 7.6 | (2,2,-2) |
| 63.18 | 1.4716 | 12.3 | (0,0,2) |
| 67.28 | 1.3916 | 14.3 | (2,1,0) |
| 67.58 | 1.3862 | 7.1 | (2,2,-1) |
| 69.36 | 1.3549 | 6.5 | (2,-1,1) |
| 70.68 | 1.3328 | 6.2 | (1,1,1) |
| 71.70 | 1.3163 | 5.9 | (1,-1,2) |
| 75.86 | 1.2541 | 14.6 | (3,1,-1) |
| 78.84 | 1.2141 | 26.5 | (2,0,1) |
| 79.67 | 1.2035 | 4.5 | (3,2,-2) |
| 83.58 | 1.1568 | 4.0 | (3,0,0) |
| 85.52 | 1.1355 | 7.7 | (1,0,2) |
Energy Properties
Electronic Properties
Magnetic Properties
Elastic Properties
Elastic data not available
Feature Analysis
Composition Overview
Traditional Material Features
Related Tasks
Citation & References
The crystal structure and related material properties of Si3Os were obtained from the Materials Project database (MP-ID: mp-978508, database version v2026.04.13).
Horton, M.K., Huck, P., Yang, R.X. et al. Accelerated data-driven materials science with the Materials Project. Nat. Mater. 24, 1522–1532 (2025). https://doi.org/10.1038/s41563-025-02272-0
3D Crystal Structure Rendering
Loading 3D structure…
# generated using pymatgen
data_Si3Os
_symmetry_space_group_name_H-M 'P 1'
_cell_length_a 4.30588777
_cell_length_b 4.30588777
_cell_length_c 4.30588777
_cell_angle_alpha 122.19233041
_cell_angle_beta 122.19233041
_cell_angle_gamma 86.24294486
_symmetry_Int_Tables_number 1
_chemical_formula_structural Si3Os
_chemical_formula_sum 'Si3 Os1'
_cell_volume 54.45306975
_cell_formula_units_Z 1
loop_
_symmetry_equiv_pos_site_id
_symmetry_equiv_pos_as_xyz
1 'x, y, z'
loop_
_atom_site_type_symbol
_atom_site_label
_atom_site_symmetry_multiplicity
_atom_site_fract_x
_atom_site_fract_y
_atom_site_fract_z
_atom_site_occupancy
Si Si0 1 0.75000000 0.25000000 0.50000000 1.0
Si Si1 1 0.25000000 0.75000000 0.50000000 1.0
Si Si2 1 0.50000000 0.50000000 0.00000000 1.0
Os Os3 1 0.00000000 0.00000000 0.00000000 1.0
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