Th2SiNiAs
高熵材料 HEAMP-ID: mp-3253704 · 空间群: P6_3/mmc (#194)
基础信息
X 射线衍射
| 2θ | d (Å) | I | hkl |
|---|---|---|---|
| 23.57 | 3.7739 | 22.8 | (0,0,0,4) |
| 24.75 | 3.5966 | 4.8 | (1,0,-1,0) |
| 24.75 | 3.5966 | 2.4 | (1,-1,0,0) |
| 25.46 | 3.4987 | 61.5 | (1,0,-1,1) |
| 25.46 | 3.4987 | 30.8 | (1,-1,0,1) |
| 30.55 | 2.9260 | 100.0 | (1,0,-1,3) |
| 34.45 | 2.6036 | 90.9 | (1,0,-1,4) |
| 38.95 | 2.3124 | 38.0 | (1,0,-1,5) |
| 43.59 | 2.0765 | 24.6 | (1,1,-2,0) |
| 43.59 | 2.0765 | 49.1 | (2,-1,-1,0) |
| 48.23 | 1.8869 | 18.0 | (0,0,0,8) |
| 49.27 | 1.8495 | 7.6 | (0,1,-1,7) |
| 49.27 | 1.8495 | 15.1 | (1,0,-1,7) |
| 50.14 | 1.8193 | 13.5 | (1,1,-2,4) |
| 50.14 | 1.8193 | 6.8 | (2,-1,-1,4) |
| 51.15 | 1.7857 | 9.8 | (2,0,-2,1) |
| 51.15 | 1.7857 | 4.9 | (2,-2,0,1) |
| 54.16 | 1.6934 | 6.9 | (0,2,-2,3) |
| 54.16 | 1.6934 | 13.7 | (2,0,-2,3) |
| 54.95 | 1.6709 | 1.9 | (1,0,-1,8) |
| 56.70 | 1.6234 | 7.3 | (0,2,-2,4) |
| 56.70 | 1.6234 | 14.6 | (2,0,-2,4) |
| 59.87 | 1.5450 | 3.7 | (0,2,-2,5) |
| 59.87 | 1.5450 | 3.7 | (2,0,-2,5) |
能量属性
电子属性
磁性属性
弹性属性
弹性数据暂不开放
特征分析
关联任务
引用参考
The crystal structure and related material properties of Th2SiNiAs were obtained from the Materials Project database (MP-ID: mp-3253704, database version v2026.04.13).
Horton, M.K., Huck, P., Yang, R.X. et al. Accelerated data-driven materials science with the Materials Project. Nat. Mater. 24, 1522–1532 (2025). https://doi.org/10.1038/s41563-025-02272-0
晶体结构 3D 渲染
加载 3D 结构...
# generated using pymatgen
data_Th2SiNiAs
_symmetry_space_group_name_H-M 'P 1'
_cell_length_a 4.15297621
_cell_length_b 4.15297678
_cell_length_c 15.09546336
_cell_angle_alpha 90.00000000
_cell_angle_beta 90.00000000
_cell_angle_gamma 119.99998752
_symmetry_Int_Tables_number 1
_chemical_formula_structural Th2SiNiAs
_chemical_formula_sum 'Th4 Si2 Ni2 As2'
_cell_volume 225.47379865
_cell_formula_units_Z 2
loop_
_symmetry_equiv_pos_site_id
_symmetry_equiv_pos_as_xyz
1 'x, y, z'
loop_
_atom_site_type_symbol
_atom_site_label
_atom_site_symmetry_multiplicity
_atom_site_fract_x
_atom_site_fract_y
_atom_site_fract_z
_atom_site_occupancy
Th Th0 1 0.33333300 0.66666700 0.37835685 1.0
Th Th1 1 0.66666700 0.33333300 0.62164315 1.0
Th Th2 1 0.66666700 0.33333300 0.87835685 1.0
Th Th3 1 0.33333300 0.66666700 0.12164315 1.0
Si Si4 1 0.33333300 0.66666700 0.75000000 1.0
Si Si5 1 0.66666700 0.33333300 0.25000000 1.0
Ni Ni6 1 0.00000000 0.00000000 0.25000000 1.0
Ni Ni7 1 0.00000000 0.00000000 0.75000000 1.0
As As8 1 0.00000000 0.00000000 0.50000000 1.0
As As9 1 0.00000000 0.00000000 0.00000000 1.0
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